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DELTA
2008
4th
IEEE International
Symposium
on
Electronic
Design,
Test &
Applications
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Submissions (Deadline Extension) Accommodation (New cutoff dates) Venue (Delta 2008 - Transportation) Past Conferences
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CALL
for Papers:
PDF Version DELTA 2008 is the 4th in a series of very successful
workshops. Its mission is to bring together scientists, engineers and
researchers from all over the world to meet and discuss cutting-edge research
and latest results in the emerging areas of electronic design, fabrication,
test, advanced system applications and related areas. Scope: Original contributions are sought in the wide and multi-disciplinary
areas of digital and analog electronics design, test and applications
including (but not limited to): Design
- Digital and Analog
Integrated Circuits and Systems - System Architecture,
Simulation and Modelling - Microprocessors, ASICs
and FPGAs - Power Electronics and
power management - Devices and process - MicroPhotonics, Opto-VLSI - Multi-Chip and packaging
technologies - Emerging Technologies and
sensors Applications
- Communications and
Networking - Signal and image
Processing, DSP - Fuzzy Logic and Neural
Networks - Instrumentation,
Measurements and Control - Medical Electronics and
Biomedical devices - Automotive, Security - Real-Time and Embedded
Systems - Multimedia Systems and
Applications Testing
- System Testing and Design
Verification - Built-In Self-test
Techniques - Design for Testability,
Boundary Scan - Analog and Mixed-Signal
and RF Test - Fault-Tolerance and
Robustness - Concurrent Checking and
On-Line Testing - Measurement for
Reliability and Safety Assessment - Characterisation Testing,
Performance Modelling and Analysis - Sequential Circuits Test
and Memory Test Special sessions: Proposals are sought for organising special sessions and
tutorials/seminars on ¡°hot topics¡± in design, test and applications. Among
the sessions of interest are: - Devices and sensors
technologies - Advances in FPGA Based
Design - MicroPhotonics and
OptoVLSI Design & Test - Embedded Systems design
and Test Submission of Papers: Prospective authors are
invited to submit: - Full paper (4-6 pages) or
an extended abstract (2-3 pages) - Affiliation and address
of each author - The contact author¡¯s
postal and e-mail address All submissions should be made electronically
as PDF (preferred) or standard non-encapsulated Postscript files through the
website http://www.ece.ust.hk/delta2008. In submitting an abstract the
authors agree that, upon acceptance, they will prepare the final manuscript
in time for the inclusion into the formal IEEE Computer Society published
proceedings, and will present the paper at the Symposium. Final manuscripts
will not be published without advance registration. Manuscripts will be
peer-reviewed by the Program Committee. Key Dates:
Further
information: Steven Zhao, Hong Kong University of Science and Technology, Electronic and Computer Engineering Dep., Clear Water Bay, Kowloon, Hong Kong, Tel. +852-2358 8526, Fax. +852-2358 1485, Email: eexjzhao@ust.hk |
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