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DELTA 2008

 

4th IEEE International

Symposium on

 

Electronic Design,

Test & Applications

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Hong Kong, January 23-25, 2008

 

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Message from General Chairs:           

 

It is our great pleasure and excitement to welcome you to the 2008 IEEE Symposium on Electronic Design, Test and Applications (DELTA 2008) that is taking place in the international city of Asia: Hong Kong. DELTA 2008 is the 4th in a series of very successful events organised under the auspices of Test Technology Technical Council of the IEEE Computer Society and in co-sponsorship and cooperation with other bodies. Its mission is to bring together scientists, engineers and researchers from all over the world to meet and discuss cutting-edge research, exchange innovative ideas and seek collaboration within and between academia and industry in rapidly growing areas of electronic design, test and applications.

The highlight of this year is the expansion of DELTA from an IEEE workshop to a full fledge IEEE symposium. This is a direct result of a healthy and steady progress of the event in terms of its significance, reputation, international exposure and diversity, as well as the quality and  extent of its technical program reflected in terms of number of papers submitted and presented. This year has also witnessed a record submission (over 210 papers) and a high standard reflected in our acceptance rate of less than 42% for our regular papers.

Our program has always been flexible adapting to very fast changes in the electronic engineering field.  This year, our sessions cover the latest advances in many new emerging areas such as biometric and security systems, FPGA and reconfigurable computing, advanced sensors design and implants, network and systems on chip, to name few.  In addition DELTA 2008 is also very delighted to host three authoritative keynote speakers from both academia (Prof. Niraj Jha of Princeton University and Prof. Charles Sodini of MIT) and industry (Dr. Stephen Lai, of Solomon Systech).  Besides the solid technical program, the diversity of nationalities and topics that we were able to attract are very impressive indeed.  DELTA is without any doubt progressively playing a key role and is becoming a superior event within IEEE in general and the design and test community in particular.

The quality of any symposium directly depends upon the selection process and the quality of the papers. Under the leadership of the program Co-Chairs Adam Osseiran, Abbes Amira and Michel Renovell, the program committee selected an outstanding set of papers. We would like to thank the Program Co-Chairs and all the TPC members for their expertise, hard work and dedication. We also thank all reviewers and authors who submitted papers and the speakers who will be presenting the papers: you are the real success holders of this symposium.

We are also grateful for our valuable sponsors: IEEE, TTTC of the IEEE Computer Society, Hong Kong University of Science and Technology, IEEE Hong Kong ED/SSC Joint Chapter. Additionally, we would like to thank our industrial sponsors and cooperating companies: Celoxica, Solomon Systech, National Instruments and Hong Kong Tourism board for their generous support to the Symposium.

Last but not least, we are confident the symposium will be highly productive and will provide participants with golden opportunities to make new contacts, meet new colleagues and refresh the existing network links as well as to discover and explore new ideas. We would like to encourage you to play a pro-active role in the symposium and to contribute to this exciting event. We hope that you will find this symposium to be a technically rewarding experience. We do hope also that you will take this opportunity to explore Hong Kong.  Above all, do enjoy DELTA 2008 and Hong Kong!

 

 

Amine Bermak,

General Co-Chair, DELTA 2008

 

Serge Demidenko,

General Co-Chair, DELTA 2008