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DELTA
2008
4th
IEEE International
Symposium
on
Electronic
Design,
Test &
Applications
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Submissions (Deadline Extension) Accommodation (New cutoff dates) Venue (Delta 2008 - Transportation) Past Conferences
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Keynote Speakers: Wednesday 23rd Jan 2008, Lecture Theatre J, LTJ. 09:40-10:20
Keynote by Professor Niraj K. Jha, EE Department, Princeton University, USA, ¡°Digital
System Testing: Emerging Issues, Trends and Solution Approaches¡± Abstract: Advances in
semiconductor and electronic design automation technology help continue the
march to miniaturization of VLSI circuits. However, these increasing levels
of integration present significant challenges to the developers of
manufacturing-time tests. They put tremendous pressure on testing cost and
time. This has led test engineers to constantly look for more efficient as
well as accurate testing approaches. Recently, satisfiability (SAT) solvers have made tremendous
strides. Although SAT-based test generation has a 15-year old history, recent
use of SAT for register-transfer level sequential test generation and design
for testability has led to techniques that are both efficient and accurate.
They can overcome several limiting assumptions hitherto made for RTL test
generation that have prevented their use in the industrial setting. These limitations
include the need for explicit controller/datapath
separation, use of all test vectors or none from the pre-computed test set
for any given module, dependence on symbolic justification (observability) paths from (to) circuit inputs (outputs)
of a module, and a lack of applicability to mixed gate-level/RTL designs. We
will discuss solution approaches that can overcome these limitations. As CMOS technology approaches its
physical limits, a tremendous amount of effort is being devoted to
nanotechnology research in order to enable future technology scaling. Recent
progress on various technologies, such as resonant tunneling diodes, quantum
cellular automata, nanowires, nanotubes,
single electron transistors, quantum computing, etc., points to promising directions
for future circuit design. However, these technologies often use new logic
primitives and thus necessitate newer fault models and test generation
approaches. We will also discuss some emerging trends in this area. About the Speaker:
Thursday 24th Jan 2008, Lecture Theatre J, LTJ. 15:20-16:00
Keynote by Professor Charles Sodini, EECS Department, Massachusetts Institute of
Technology, USA, ¡°System Drivers for Mixed Signal Integrated Circuit Design Research¡± Abstract: Mixed signal circuit design research is often carried out using design
requirements that are determined by a system driver. One popular choice for system drivers
is to use the latest evolving standards.
However, these systems are often constrained and prevent the
experimentation with novel circuit and system concepts. It has been our experience that the
opportunity for innovation in mixed signal circuit design is enhanced when a
system driver is conceived using state-of-the-art system concepts. An example of such a driver is the
Wireless Gigabit Local Area Network (WiGLAN) that
was used as a system driver for communication circuit research from
1998-2006. The WiGLAN offers Gb/s
data rates in the 5GHz band using the concept of adaptive modulation of sub-channels
produced using orthogonal frequency division multiplexing. To reduce the SNR
required for a given bit error rate, the WiGLAN
employs the use of multiple antennas to increase spatial diversity. Each antenna requires its own
independent receiver. A description of the WiGLAN
and some of the research ICs that were designed with this system driver will
be presented. A recent example of another system driver is an active mm-wave imaging system for automotive applications. Millimeter-wave radiation and detection offers the capability of two-dimensional imaging of vehicles within the range of approximately 50-100 meters. Active transmission of a known signal modulated to carrier frequencies at 77 GHz and higher act as the ¡°illumination¡± of the vehicle to be imaged. The reflected signal is scanned by an array of receivers (e.g. 32x32) to receive a number of ¡°looks¡± at the object. After down-conversion to approximately 1 GHz, digitization of the signal is performed. Advanced digital signal processing is used to obtain intensity measurement of a two-dimensional array of ¡°pixels¡± on the vehicle. It is expected that this system will guide mm-wave IC design for the next few years. About the Speaker:
Friday 25th Jan 2008, Lecture Theatre J, LTJ. 13:20-14:00
Keynote by Dr Stephen Lai, Solomon Systech,
Abstract: The For driver electronics to keep up with these amazing display
technologies are no easy tasks. Driver electronics are indeed providing the
driving forces for the commercialization of these display technologies, from
enhancing the dominant technologies into ever increasing performance levels,
to enabling the new emerging technologies or developing new applications. This
talk will attempt to showcase the About the Speaker:
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